An Automated BIST Approach for Mixed-Signal Systems

A Built-In Self-Test (BIST) approach that is designed to test the analog portion of mixed-signal systems is described. The majority of the BIST circuitry is located in the digital domain to minimize performance impact on the analog circuitry as well as to facilitate easy and automated synthesis of the BIST circuitry. The BIST approach has been implemented in parameterized VHDL for inclusion in any VHDL-AMS description and supports any size Digital-to-Analog Converter (DAC) and Analog-to-Digital Converter (ADC) from 4 to 24-bits. The BIST approach provides sixteen test waveforms and three output response analysis modes to test a wide variety of analog application circuits. 1